Capabilities

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Accelerated Stress Testing with in-situ reference electrodes (for Anode degredation)
Accelerated Stress Testing (AST)
Bulk electrode limiting current
Local transport limiting current
CO Displacement Chronoamperometry
Operando electrochemical accessibility
Focused ion beam (FIB)
Micro and Nano- X-ray computed tomography (synchrotron)
Scanning electron microscopy (SEM)
Scanning transmission electron microscopy (STEM)
Ultra-small, small, and wide-angle X-ray scattering (USAXS, SAXS, WAXS)
X-ray fluorescence spectroscopy (XRF)
Atomic Force Microscopy (AFM)
Laser profilometer
Transmission electron microscopy (TEM)